Trigger Alarm: A Smart NFC Sniffer for High-Precision Measurements - Testing Software and Systems
Conference Papers Year : 2020

Trigger Alarm: A Smart NFC Sniffer for High-Precision Measurements

Martin Erb
  • Function : Author
  • PersonId : 1100042
Christian Steger
  • Function : Author
  • PersonId : 1100043
Martin Troyer
  • Function : Author
  • PersonId : 1100044
Josef Preishuber-Pflügl
  • Function : Author
  • PersonId : 1100045

Abstract

In this paper, we present a new design and proof of concept of a smart Near Field Communication (NFC) sniffer, including special trigger features for high-precision measurements during NFC interoperability testing. Even though interoperability testing is not mandatory for successful NFC-device certification, the fast increasing amount of electronic consumer devices providing NFC functionality strongly increases the need for interoperability testing. Nowadays, used automated interoperability test systems require time-consuming and expensive manual debug sessions in case of a communication error, to compensate missing test data for analyzing the failure root cause. To highly decrease costs and time required to perform these manual measurements, we developed a proof of concept of a sniffer tool providing intelligent trigger functionalities. It supports the test engineer during manual debug session and can be integrated into a fully automated interoperability test and analysis system. Hence, we drive the development of automated interoperability test systems and want to encourage standardization bodies to include interoperability testing to the certification procedure.
Fichier principal
Vignette du fichier
497758_1_En_12_Chapter.pdf (1.73 Mo) Télécharger le fichier
Origin Files produced by the author(s)

Dates and versions

hal-03239810 , version 1 (27-05-2021)

Licence

Identifiers

Cite

Martin Erb, Christian Steger, Martin Troyer, Josef Preishuber-Pflügl. Trigger Alarm: A Smart NFC Sniffer for High-Precision Measurements. 32th IFIP International Conference on Testing Software and Systems (ICTSS), Dec 2020, Naples, Italy. pp.186-200, ⟨10.1007/978-3-030-64881-7_12⟩. ⟨hal-03239810⟩
111 View
87 Download

Altmetric

Share

More