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		Generating Biased Dataset for Metamorphic Testing of Machine Learning Programs Shin Nakajima , Tsong Yueh Chen 31th IFIP International Conference on Testing Software and Systems (ICTSS), Oct 2019, Paris, France. pp.56-64, ⟨10.1007/978-3-030-31280-0_4⟩ Conference papers hal-02526339v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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