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		New Scan-Based Attack Using Only the Test Mode and an Input Corruption Countermeasure Sk Subidh Ali , Samah Mohamed Saeed , Ozgur Sinanoglu , Ramesh Karri 21th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSI-SoC), Oct 2013, Istanbul, Turkey. pp.48-68, ⟨10.1007/978-3-319-23799-2_3⟩ Conference papers hal-01380298v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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