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		Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors Maedeh Hemmat , Mehdi Kamal , Ali Afzali-Kusha , Massoud Pedram 24th IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip (VLSISOC), Sep 2016, Tallinn, Estonia. pp.41-59, ⟨10.1007/978-3-319-67104-8_3⟩ Conference papers hal-01675198v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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