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		Pattern Discovery from Big Data of Food Sampling Inspections Based on Extreme Learning Machine Yi Liu , Xin Li , Jianxin Wang , Feng Chen , Junyu Wang , et al. 11th International Conference on Research and Practical Issues of Enterprise Information Systems (CONFENIS), Oct 2017, Shanghai, China. pp.132-142, ⟨10.1007/978-3-319-94845-4_12⟩ Conference papers hal-01888631v1	Send to ORCID Export BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Advanced export Share Gmail Facebook X LinkedIn More

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